ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,938, issued on Sept. 8, was assigned to Supercell Oy (Helsinki). "Method and system for detection of tampering in executable code" was inve... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,939, issued on Sept. 8, was assigned to Micron Technology Inc. (Boise, Idaho). "Threat detection using a measured storage device" was inven... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,940, issued on Sept. 8, was assigned to Microsoft Technology Licensing LLC (Redmond, Wash.). "State clearing of internal memory and flip-fl... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,941, issued on Sept. 8, was assigned to Siemens Industry Software Inc. (Plano, Texas). "Combined microstructure and object boundary represe... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,942, issued on Sept. 8, was assigned to BHN Holding LLC (West Palm Beach, Fla.). "Apparatus and methods for facilitating a multi-model home... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,943, issued on Sept. 8, was assigned to HERSS Co. LTD. (Guri-si, South Korea). "Simulation apparatus for confirming optimized installation ... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,944, issued on Sept. 8, was assigned to Kubota Corp. (Osaka, Japan). "Piping diagram creation method and piping diagram creation device" wa... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,945, issued on Sept. 8, was assigned to AT&T Intellectual Property I LP (Atlanta). "Feature selection method and system for regression anal... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,946, issued on Sept. 8, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Verification for improving quality of maintenance of... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,948, issued on Sept. 8, was assigned to Accenture Global Solutions Ltd. (Dublin). "Method and device for dynamic failure mode effect analys... और पढ़ें